Applied Materials Semvision G3 Fib Treatment
The work described in this article has been performed at ASML using Applied Materials' SEMVision G3 FIB automated defect review and analysis tool. Applied Materials, Inc. (Nasdaq:AMAT) launches its revolutionary Applied SEMVision G2 FIB Defect Analysis system, the first in-line production tool to integrate advanced defect review SEM. Materials, capsule chamber FEoL Backside single wafer cleaning: all kinds of acids, bases or water based cleaner, all BEoL materials, backside clean chamber FEoL Repair and surface treatment: all kinds of solvents or other chemical, all BEoL materials BEoL Anneal Furnace N 2, NH 3, Cl 2, NF 3, O 2 FEoL N 2, H 2, Ar BEoL.
Applied Materials Semvision G3 Fib Test
Applied Materials SEM Vision G2 - CHiP Semiconductors Customer Service: 512-203-4367 or 12400 West Highway 71, Suite 350-138 AustinTexas 78738Specialty Wafer Evaluation and ProcessingSemiconductor Equipment (Front-end) Resale, Inspection, and ValuationID3473ManufacturerApplied MaterialsModelSEM Vision G2DescriptionSEMReference NumberSerial #SECNECIManufacture DateConfigurationOffline Review Station only for a SEMvision G2Condition/WarrantyAs-is, where-isAsking PriceInquireFOB PointAustin TexasCopyright 2019, CHiP Semiconductor. All Rights Reserved.